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To ensure the quality of microprocessor chips manufactured by Sigma Electronics,

ID: 405046 • Letter: T

Question

To ensure the quality of microprocessor chips manufactured by Sigma Electronics, the quality control department samples 100 chips produced each day.  These chips are subjected to extreme operating conditions for several hours.  At the end of the test, the numbers of failed chips are reported.  Table 11.11 shows the results for the last 20 test runs.  Create a p chart, then report if the production process is in control.

Table 11.11

Sample Number

Number of Failed Microprocessor Chips

1

3

2

0

3

2

4

1

5

4

6

9

7

2

8

5

9

4

10

6

11

0

12

3

13

5

14

2

15

4



Table 11.11

Sample Number

Number of Failed Microprocessor Chips

1

3

2

0

3

2

4

1

5

4

6

9

7

2

8

5

9

4

10

6

11

0

12

3

13

5

14

2

15

4

Explanation / Answer

we can use simple statistics to create a p chart with an upper control limit (UCL) and a lower control limit (LCL). We can draw these control limits on a graph and then plot the fraction defective of each individual sample tested. The process is assumed to be working correctly when the samples, which are taken periodically during the day, continue to stay between the control limits.
Sample Number No.of chips inspected Number of Failed Microprocessor Chips Fraction defective 1 100 3 0.03 2 100 0 0 3 100 2 0.02 4 100 1 0.01 5 100 4 0.04 6 100 9 0.09 7 100 2 0.02 8 100 5 0.05 9 100 4 0.04 10 100 6 0.06 11 100 0 0 12 100 3 0.03 13 100 5 0.05 14 100 2 0.02 15 100 4 0.04 TOTAL 50 Total no.of samples tested = 1500

To construct the control chart, first calculate the overall fraction defective from all samples. This sets the centerline for the control chart. p = Total number of defects from all samples / Number of samples

To construct the control chart, first calculate the overall fraction defective from all samples. This sets the centerline for the control chart. p = Total number of defects from all samples / Number of samples Sample Number No.of chips inspected Number of Failed Microprocessor Chips Fraction defective 1 100 3 0.03 2 100 0 0 3 100 2 0.02 4 100 1 0.01 5 100 4 0.04 6 100 9 0.09 7 100 2 0.02 8 100 5 0.05 9 100 4 0.04 10 100 6 0.06 11 100 0 0 12 100 3 0.03 13 100 5 0.05 14 100 2 0.02 15 100 4 0.04 TOTAL 50 Total no.of samples tested = 1500
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